From f6d99980ba1a31976a52e36c3a0b9e7405fd392f Mon Sep 17 00:00:00 2001
From: Derek Foreman <derekf@osg.samsung.com>
Date: Fri, 29 Apr 2016 11:34:51 -0500
Subject: [PATCH] Remove GL presence test from native surface set on dirty
 objects

This test has been pushed into e_comp_object_native_surface_set() and
will be done as appropriate.

Upcoming wayland DMAbuf buffers need native surfaces even if GL isn't
present.
---
 src/bin/e_comp_object.c | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/src/bin/e_comp_object.c b/src/bin/e_comp_object.c
index b9e95022c..05f8fc990 100644
--- a/src/bin/e_comp_object.c
+++ b/src/bin/e_comp_object.c
@@ -3778,7 +3778,7 @@ e_comp_object_dirty(Evas_Object *obj)
           ERR("ERROR FETCHING PIXMAP FOR %p", cw->ec);
         return;
      }
-   e_comp_object_native_surface_set(obj, e_comp->gl);
+   e_comp_object_native_surface_set(obj, 1);
    it = eina_tiler_iterator_new(cw->updates);
    EINA_ITERATOR_FOREACH(it, rect)
      {