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authorAvi Levin <avi.levin@samsung.com>2015-01-12 13:34:01 +0200
committerTom Hacohen <tom@stosb.com>2015-01-12 11:56:42 +0000
commitdad44a7100581ecc050271e9035c4f66dd2ed6ea (patch)
treec6ca52aa452b28b32ad4b0ca32b7d3e4a441fb78 /NEWS
parent82014cad2c11b40e455e0578d22f09b04ebd1e5c (diff)
Eo tests: Fix bad free in eo_test_value
When running eo_test_suite we get an memory error: "double free or corruption". That error arises because we try to free an Eina_Value value in eo_test_value that doesn't need to freed. I switched the eina_value_free to wina_value_flush, the proper way of releasing it. @fix
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