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authorCedric Bail <cedric@osg.samsung.com>2017-09-13 15:52:40 -0700
committerCedric Bail <cedric@osg.samsung.com>2017-09-13 15:53:00 -0700
commitb9ef9af74a4cc401c02468f20a68659b9b2a1235 (patch)
tree09740386a9da902389c689d0b96524bf09dd3d73 /src/tests/eio/eio_test_manager_xattr.c
parentba34b998eb6920fe0dbccd1037e8344c028754ec (diff)
eio: migrate efl.io.manager.open to use Eina_Future.
Diffstat (limited to '')
-rw-r--r--src/tests/eio/eio_test_manager_xattr.c2
1 files changed, 1 insertions, 1 deletions
diff --git a/src/tests/eio/eio_test_manager_xattr.c b/src/tests/eio/eio_test_manager_xattr.c
index 3d41316f20..bb2ddece02 100644
--- a/src/tests/eio/eio_test_manager_xattr.c
+++ b/src/tests/eio/eio_test_manager_xattr.c
@@ -118,7 +118,7 @@ _error_cb(void *data EINA_UNUSED, const Efl_Event *ev)
118} 118}
119 119
120static Eina_Value 120static Eina_Value
121_future_all_cb(const void *data, 121_future_all_cb(void *data,
122 const Eina_Value array, 122 const Eina_Value array,
123 const Eina_Future *dead EINA_UNUSED) 123 const Eina_Future *dead EINA_UNUSED)
124{ 124{