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authorCedric Bail <cedric@osg.samsung.com>2017-09-13 18:03:05 -0700
committerCedric Bail <cedric@osg.samsung.com>2017-09-14 10:11:29 -0700
commitcba58203a32d4c586570cf2bb47cbcc048d803d4 (patch)
treef5e671ead38e46c822cb9f069823ea9e65796d1e /src/tests/eio
parent024c6a9fc33c9fc0056f9e6b35dee64fb74cd225 (diff)
eio: move efl.io.manager.xattr.get to use the new Eina_Future.
Diffstat (limited to 'src/tests/eio')
-rw-r--r--src/tests/eio/eio_test_manager_xattr.c19
1 files changed, 1 insertions, 18 deletions
diff --git a/src/tests/eio/eio_test_manager_xattr.c b/src/tests/eio/eio_test_manager_xattr.c
index bb2ddece02..15615ebb81 100644
--- a/src/tests/eio/eio_test_manager_xattr.c
+++ b/src/tests/eio/eio_test_manager_xattr.c
@@ -90,23 +90,6 @@ _done_get_cb(void *data EINA_UNUSED, const Efl_Event *ev)
90} 90}
91 91
92static void 92static void
93_done_set_cb(void *data, const Efl_Event *ev)
94{
95 Efl_Future_Event_Success *success = ev->info;
96 Eina_Accessor *ac = success->value;
97 int *placeholder;
98 int *num_of_attr = data;
99 int i = 0;
100
101 EINA_ACCESSOR_FOREACH(ac, i, placeholder)
102 *num_of_attr += 1;
103
104 fail_if(*num_of_attr != total_attributes);
105
106 ecore_main_loop_quit();
107}
108
109static void
110_error_cb(void *data EINA_UNUSED, const Efl_Event *ev) 93_error_cb(void *data EINA_UNUSED, const Efl_Event *ev)
111{ 94{
112 Efl_Future_Event_Failure *failure = ev->info; 95 Efl_Future_Event_Failure *failure = ev->info;
@@ -146,7 +129,7 @@ _future_all_cb(void *data,
146 } 129 }
147 } 130 }
148 131
149 fail_if(*num_of_attr != len); 132 fail_if(*num_of_attr != (int) len);
150 return array; 133 return array;
151} 134}
152 135