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authorCedric Bail <cedric@osg.samsung.com>2018-04-24 14:24:36 -0700
committerCedric BAIL <cedric@osg.samsung.com>2018-05-01 10:39:01 -0700
commitdb589dd63025c7ec25cb483491ef6e8262ac5300 (patch)
treee632a237cb97f6ea33a8046cbb54d13af00584e4 /src/tests/eio
parente7d5d34158f6328b7eaae63b9ee7f58962fb9949 (diff)
eio: fix efl.io.manager test after API const change.
Diffstat (limited to 'src/tests/eio')
-rw-r--r--src/tests/eio/eio_test_manager.c2
1 files changed, 1 insertions, 1 deletions
diff --git a/src/tests/eio/eio_test_manager.c b/src/tests/eio/eio_test_manager.c
index 3f82af51cf..7501111fc1 100644
--- a/src/tests/eio/eio_test_manager.c
+++ b/src/tests/eio/eio_test_manager.c
@@ -160,7 +160,7 @@ _stat_done_cb(void *data,
160} 160}
161 161
162static void 162static void
163_test_ls(Eina_Future *(*func)(Eo *obj, const char *path, Eina_Bool recursive, 163_test_ls(Eina_Future *(*func)(const Eo *obj, const char *path, Eina_Bool recursive,
164 void *info_data, EflIoDirectInfo info, Eina_Free_Cb info_free_cb), 164 void *info_data, EflIoDirectInfo info, Eina_Free_Cb info_free_cb),
165 uint64_t expected_test_count, 165 uint64_t expected_test_count,
166 const char* test_dirname) 166 const char* test_dirname)