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authorCedric BAIL <cedric@osg.samsung.com>2018-05-22 16:15:02 -0700
committerCedric BAIL <cedric@osg.samsung.com>2018-05-24 16:02:20 -0700
commit34897080525ca0ccf87a707c143d5d5286202c7c (patch)
tree3f0bcdc522d4aad3df694aead1246ea3401971dd /src/tests/eo/suite/eo_test_general.c
parent0c0f2b75e4c672ccab97f66b71f03824bc819460 (diff)
eo: we are actually testing internal function too here.
Diffstat (limited to 'src/tests/eo/suite/eo_test_general.c')
-rw-r--r--src/tests/eo/suite/eo_test_general.c2
1 files changed, 2 insertions, 0 deletions
diff --git a/src/tests/eo/suite/eo_test_general.c b/src/tests/eo/suite/eo_test_general.c
index 44ba773681..0ec6b35aed 100644
--- a/src/tests/eo/suite/eo_test_general.c
+++ b/src/tests/eo/suite/eo_test_general.c
@@ -11,6 +11,8 @@
11 11
12#include <Eo.h> 12#include <Eo.h>
13 13
14#include "eo_internal.h"
15
14#include "eo_suite.h" 16#include "eo_suite.h"
15#include "eo_test_class_simple.h" 17#include "eo_test_class_simple.h"
16#include "eo_test_class_singleton.h" 18#include "eo_test_class_singleton.h"