slightly better debug info for eeze scanner connection

SVN revision: 65361
This commit is contained in:
Mike Blumenkrantz 2011-11-18 04:55:52 +00:00
parent 768dd7691d
commit c2b9cb4b56
1 changed files with 3 additions and 2 deletions

View File

@ -625,6 +625,7 @@ _scanner_run(void)
static Eina_Bool static Eina_Bool
_scanner_con(void *data __UNUSED__, int type __UNUSED__, Ecore_Con_Event_Server_Del *ev __UNUSED__) _scanner_con(void *data __UNUSED__, int type __UNUSED__, Ecore_Con_Event_Server_Del *ev __UNUSED__)
{ {
INF("Scanner connected");
es_con = eet_connection_new(_scanner_read, _scanner_write, NULL); es_con = eet_connection_new(_scanner_read, _scanner_write, NULL);
return ECORE_CALLBACK_RENEW; return ECORE_CALLBACK_RENEW;
} }
@ -632,7 +633,7 @@ _scanner_con(void *data __UNUSED__, int type __UNUSED__, Ecore_Con_Event_Server_
static Eina_Bool static Eina_Bool
_scanner_disc(void *data __UNUSED__, int type __UNUSED__, Ecore_Con_Event_Server_Del *ev __UNUSED__) _scanner_disc(void *data __UNUSED__, int type __UNUSED__, Ecore_Con_Event_Server_Del *ev __UNUSED__)
{ {
INF("lost connection to scanner"); INF("Scanner disconnected");
if (_scanner_poll(NULL)) if (_scanner_poll(NULL))
_scanner_run(); _scanner_run();
return ECORE_CALLBACK_RENEW; return ECORE_CALLBACK_RENEW;
@ -641,7 +642,7 @@ _scanner_disc(void *data __UNUSED__, int type __UNUSED__, Ecore_Con_Event_Server
static Eina_Bool static Eina_Bool
_scanner_err(void *data __UNUSED__, int type __UNUSED__, Ecore_Con_Event_Server_Error *ev __UNUSED__) _scanner_err(void *data __UNUSED__, int type __UNUSED__, Ecore_Con_Event_Server_Error *ev __UNUSED__)
{ {
INF("error"); INF("Scanner connection error");
return ECORE_CALLBACK_RENEW; return ECORE_CALLBACK_RENEW;
} }