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tests: reduce looping in eina_binshare_putstuff test 

also slightly increase eina_hash coverage

fix T6843

Reviewed-by: Stefan Schmidt <stefan@osg.samsung.com>
This commit is contained in:
Mike Blumenkrantz 2018-03-30 15:41:33 -04:00 committed by Stefan Schmidt
parent d5583d74ea
commit e8878e19b7
1 changed files with 9 additions and 4 deletions
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13
src/tests/eina/eina_test_binshare.c
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@ -115,14 +115,19 @@ EFL_START_TEST(eina_binshare_putstuff)
const char *tmp;
int i;
for (i = 10000; i > 0; --i)
for (i = 100; i > 0; --i)
{
char build[64] = "string_";
unsigned int len;
eina_convert_xtoa(i, build + 7);
tmp = eina_binshare_add_length(build, strlen(build));
fail_if(tmp != eina_binshare_add_length(build, strlen(build)));
fail_if((int)strlen(build) != eina_binshare_length(tmp));
len = strlen(build);
tmp = eina_binshare_add_length(build, len);
ck_assert_ptr_nonnull(tmp);
ck_assert_ptr_eq(tmp, eina_binshare_add_length(build, len));
ck_assert_int_eq(len, eina_binshare_length(tmp));
eina_binshare_del(tmp);
eina_binshare_del(tmp);
}
}
EFL_END_TEST