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tests: reduce looping in eina_test_spinlock 

no changes to coverage

fix T6845

Reviewed-by: Stefan Schmidt <stefan@osg.samsung.com>
This commit is contained in:
Mike Blumenkrantz 2018-03-30 16:52:20 -04:00 committed by Stefan Schmidt
parent 7819d56da6
commit 88436ca89c
1 changed files with 3 additions and 3 deletions
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6
src/tests/eina/eina_test_lock.c
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@ -71,7 +71,7 @@ _eina_test_lock_thread(void *data, Eina_Thread t)
fail_if(!eina_thread_equal(t, thread));
fail_if(strcmp("test", data));
for (i = 0; i < 10000; i++)
for (i = 0; i < 150; i++)
{
fail_if(eina_spinlock_take(&spin) != EINA_LOCK_SUCCEED);
counter++;
@ -91,7 +91,7 @@ EFL_START_TEST(eina_test_spinlock)
fail_if(!eina_thread_create(&thread, EINA_THREAD_NORMAL, -1, _eina_test_lock_thread, "test"));
for (i = 0; i < 10000; i++)
for (i = 0; i < 150; i++)
{
fail_if(eina_spinlock_take(&spin) != EINA_LOCK_SUCCEED);
counter++;
@ -100,7 +100,7 @@ EFL_START_TEST(eina_test_spinlock)
fail_if(strcmp("test", eina_thread_join(thread)));
fail_if(counter != 20000);
fail_if(counter != 300);
fail_if(eina_spinlock_take_try(&spin) != EINA_LOCK_SUCCEED);
fail_if(eina_spinlock_release(&spin) != EINA_LOCK_SUCCEED);