forked from enlightenment/efl
tests_: elementary: remove not used allocation in collection view test
Allocated but never used (and never freed). Seems like a copy and paste bug to me. CID: 1412363 Signed-off-by: Stefan Schmidt <s.schmidt@samsung.com> Reviewed-by: Marcel Hollerbach <mail@marcel-hollerbach.de> Differential Revision: https://phab.enlightenment.org/D11442
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@ -45,12 +45,8 @@ static Eina_Value
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_children_get(Eo *obj EINA_UNUSED, void *data EINA_UNUSED, const Eina_Value v)
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_children_get(Eo *obj EINA_UNUSED, void *data EINA_UNUSED, const Eina_Value v)
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{
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{
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Efl_Model *child;
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Efl_Model *child;
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Eina_Future **all;
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unsigned int i, len;
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unsigned int i, len;
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all = calloc(1 + 1, sizeof(Eina_Future*));
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if (!all) return eina_value_error_init(ENOMEM);
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EINA_VALUE_ARRAY_FOREACH(&v, len, i, child)
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EINA_VALUE_ARRAY_FOREACH(&v, len, i, child)
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{
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{
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Eina_Value *rel_val, *title_val;
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Eina_Value *rel_val, *title_val;
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