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tests: reduce looping in slstr_thread thread callbacks 

this works out to the same number of total tests as slstr_many but
now split across all the threads

fix T6846

Reviewed-by: Stefan Schmidt <stefan@osg.samsung.com>
This commit is contained in:
Mike Blumenkrantz 2018-03-30 16:58:31 -04:00 committed by Stefan Schmidt
parent 88436ca89c
commit 594b5f4967
1 changed files with 4 additions and 4 deletions
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8
src/tests/eina/eina_test_slstr.c
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@ -126,9 +126,9 @@ EFL_START_TEST(slstr_slstr_printf)
EFL_END_TEST
static void
_many_do(void)
_many_do(Eina_Bool threaded)
{
const int many = 2048;
const int many = threaded ? 256 : 2048;
Eina_Slstr *str;
int k;
@ -145,7 +145,7 @@ _many_do(void)
EFL_START_TEST(slstr_many)
{
_many_do();
_many_do(0);
eina_slstr_local_clear();
@ -155,7 +155,7 @@ EFL_END_TEST
static void *
_thread_cb(void *data EINA_UNUSED, Eina_Thread th EINA_UNUSED)
{
_many_do();
_many_do(1);
return NULL;
}